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[Alpha Biz=(Chicago) Reporter Kim Jisun] LG Innotek will be able to catch defects in the design of substrate products from the beginning with artificial intelligence (AI). It is expected that this will increase the yield of products.
LG Innotek announced on the 25th that it has introduced 'AI-based design preliminary analysis system' to find defects in substrate product design. From this year, AI has been applied to design analysis of package substrate (PS) products for semiconductors such as radio frequency system RF-SiP and antenna in package (AiP).
LG Innotek has introduced an AI pre-analysis system by learning 16,000 data preprocessing defect patterns and vulnerabilities.
As a result, LG Innotek will be able to find more than 90% of defective areas even if new substrate drawings come in. In addition, AI was introduced and objective data reading standards were established.
AlphaBIZ 김지선(stockmk2020@alphabiz.co.kr)
